---

name: stm-analyzer description: Scanning Tunneling Microscopy skill for atomic-resolution imaging and local density of states measurements allowed-tools:

• Read
• Write
• Glob
• Grep
• Bash metadata: specialization: nanotechnology domain: science category: microscopy-characterization priority: medium phase: 6 tools-libraries:
  • WSxM
  • SPECS software
  • Custom STM analysis tools graph: domains: [domain:nanotechnology] skillAreas: [skill-area:mathematical-reasoning, skill-area:physics-simulation, skill-area:data-analysis] workflows: [workflow:experiment-design] roles: [role:research-engineer]

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STM Analyzer

Purpose

The STM Analyzer skill provides atomic-resolution surface analysis through scanning tunneling microscopy, enabling visualization of atomic structures and measurement of local electronic properties.

Capabilities

• Atomic-resolution imaging
• STS (Scanning Tunneling Spectroscopy)
• Local density of states mapping
• Surface reconstruction analysis
• Molecular imaging
• Low-temperature operation protocols

Usage Guidelines

STM Analysis

1. Imaging

   • Optimize tunneling parameters
   • Apply drift correction
   • Identify atomic features

2. Spectroscopy

   • Acquire dI/dV spectra
   • Map electronic states
   • Identify band structure features

3. Data Processing

   • Apply Fourier filtering
   • Correct for thermal drift
   • Calibrate atomic distances

Process Integration

• In-Situ Characterization Experiment Design
• Structure-Property Correlation Analysis

Input Schema

{
  "data_file": "string",
  "analysis_type": "imaging|spectroscopy|sts_mapping",
  "bias_voltage": "number (V)",
  "setpoint_current": "number (nA)"
}

Output Schema

{
  "imaging": {
    "atomic_structure": "string",
    "lattice_constant": "number (nm)",
    "defects_identified": ["string"]
  },
  "spectroscopy": {
    "band_gap": "number (eV)",
    "fermi_level": "number (eV)",
    "density_of_states": {"energy": [], "dos": []}
  }
}