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fib-mill-controller

fib-mill-controller

Focused Ion Beam milling skill for site-specific nanofabrication and cross-section preparation

Independent GitHub snapshot · Automated classification · Original documentation governs

Documentation de la Skill

GitHub

name: fib-mill-controller description: Focused Ion Beam milling skill for site-specific nanofabrication and cross-section preparation allowed-tools:

  • Read
  • Write
  • Glob
  • Grep
  • Bash metadata: specialization: nanotechnology domain: science category: fabrication priority: medium phase: 6 tools-libraries:
    • FIB pattern generators
    • Dual-beam workflow automation graph: domains: [domain:nanotechnology] skillAreas: [skill-area:mathematical-reasoning, skill-area:physics-simulation, skill-area:data-analysis] workflows: [workflow:experiment-design] roles: [role:research-engineer]

FIB Mill Controller

Purpose

The FIB Mill Controller skill provides focused ion beam process control for site-specific nanofabrication and sample preparation, enabling precise material removal and deposition at the nanoscale.

Capabilities

  • TEM lamella preparation
  • Nanoscale milling and deposition
  • Pattern writing and editing
  • Cross-section imaging
  • Gas-assisted etching/deposition
  • Damage minimization protocols

Usage Guidelines

FIB Processing

  1. TEM Lamella Preparation

    • Deposit protective cap
    • Rough mill with high current
    • Fine polish to target thickness
  2. Nanofabrication

    • Define pattern geometry
    • Optimize beam parameters
    • Minimize gallium implantation
  3. Circuit Editing

    • Navigate to target location
    • Selective material removal
    • Metal deposition for reconnection

Process Integration

  • Nanodevice Integration Process Flow
  • Multi-Modal Nanomaterial Characterization Pipeline

Input Schema

{
  "operation": "lamella|milling|deposition|cross_section",
  "material": "string",
  "target_thickness": "number (nm, for lamella)",
  "pattern_file": "string (for milling)",
  "beam_voltage": "number (kV)"
}

Output Schema

{
  "process_parameters": {
    "beam_current": "number (pA)",
    "dwell_time": "number (us)",
    "overlap": "number (%)"
  },
  "milling_depth": "number (nm)",
  "lamella_thickness": "number (nm)",
  "damage_layer": "number (nm)",
  "processing_time": "number (minutes)"
}
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